Xrf Coating Thickness Measurement Machine

• Customization: Available
• After-sales Service: International Warranty
• Warranty: One
• Model NO.: EDX2000A
• Appliance: Plating Thickness Test
• Ray Type: γ-Ray Spectrometer
• Gaspath System: Edxrf
• Detector: Sdd Detector
• Energy Resolution: 135EV
• Certification: CE, ISO, IEC
• Spectrometer Detector: SDD
• Stationary Phase: Edxrf
• Mobile Phase: Edxrf
• Chromatography Type: Edxrf
• Chromatographic Column Type: None
• Chromatographic Column Length: None
• Chromatographic Column Diameter: None
• Measurement Range: From K to U
• Net Weight: 96kg
• Packing Size: 73*58*70
• Certificate: CE, ISO
• Transport Package: Standard International Packing
• Specification: Desktop Spectrometer
• Trademark: skyray instrument
• Origin: Jiangsu, China
• HS Code: 9022199090
• Production Capacity: 280units/Month

Product Description

Product Description

Instrument introduction

EDX2000A is the professional XRF plating thickness analyzer.  It is with full-auto software operation, multi-point testing, software controlling the instrument and movable platform.
 

Product Parameters

Instrument Features

1. Top-lightening
2. Test parts can be lifted up and down
3. High-precision moveable platform
4. Small collimator
5. High-resolution SDD detector
6. Visual operation
7. Auto locate height
8. Auto search test spot
9. Mouse locates the test point
10. Super large chamber design

Applications fields:
Thickness test of gold, silver, Rhodium plated jewelries
PCB factory
Electro plating factory 
Ect.
 

Technical Specifications
Measurable elements:	Sulfur ( S ) - Uranium ( U )
Plating Thickness	up to 20um
Repeatability:	0.1%
Stability:	0.1%
Energy Resolution	135eV
Power:	AC 220V ± 5V or AC 110V ± 5V. AC purified voltage power supply
Sample chamber size:	52cm x 40cm x 15cm
Size:	69cm x 57cm x 66cm
Work Temperature:	15ºC -30 ºC