Building upon the cumulative performance of over tens of thousands of energy-dispersive analysis devices, Skyray Instrument has dedicated a decade to create a new generation analyzer, the EDX6000C, which integrates various testing needs into one instrument.
This instrument features a large-area graphene ultra-thin window electrically cooled semiconductor SDD detector, an ultra-low-loss test optical path, an ultra-thin beryllium window Oxford tube excitation light source, Siemens PLC control for single-sample and multi-sample chamber systems (with options for 9, 12, and 20 sample chambers), a combined vacuum and helium system, a sample spinning system, and a three-fold security protection system for the instrument (detector anti-puncture function, high-voltage key protection, and sample cover self-locking function). The instrument seamlessly combines single-sample and multi-sample chamber injection modes. It is complemented by Skyray's latest research achievement, the XRF composition analysis software version 4.0 and RoHS 5.0 full intelligent version software. It enables one-click testing for both liquid and solid samples. Its powerful intelligent algorithms can automatically identify sample materials and select the appropriate curve, achieving true intelligent automatic detection for multi-sample positions.
The instrument offers low operating costs, improved maintenance performance, and enhanced convenience. It can be applied to a wide range of fields, from product management subject to regulations such as RoHS/ELV directives and toy directives, to everyday research in general material analysis. This includes element analysis in various industries, ranging from electronic and electrical materials to metal composition analysis, automotive mechanical testing, petrochemical element analysis, pharmaceutical and food quality control, geological mineral element analysis, and analysis in industries such as cement, refractory materials, and glass.
Multiple Protection,
Safety Assurance
The detector protection device closes the detector window after instrument testing to prevent damage to the detector window. The instrument's protective cover, electromagnetic lock, and tube high-voltage interlock prevent the sample chamber cover from being opened during the testing process, thus preventing accidental harm to the operator when the cover is opened. Software misoperation reminders, a three-dimensional maze-like instrument design, electronic interlock sensing, mechanical isolation safety lock protection, and software abnormal interruption are multiple protective measures that ensure the safety of users.
Auto Sample Loading, Unmanned Operation
The system is equipped with Siemens PLC control for 9-sample, 12-sample, and 20-sample chamber configurations. 12-sample and 20-sample chambers can be switched to a single sample chamber in one second, meeting the testing requirements for small and large samples. The 9-sample chamber rotation system improves the testing of non-homogeneous sample elements. Using multi-sample chamber systems for sample introduction can lead to a 50% reduction in equipment costs, and through human-machine cooperation, it can boost labor efficiency by 50%.
Instrument Parameters
Elemental Analysis Range: Fluorine (F) to Uranium (U)
Analytical Detection Limit: As low as 0.2 ppm (for light matrices)
Analytical Range: ppm to 99.99%
Analytical Accuracy: <0.05% (RSD value for multiple repeated measurements of main elements in samples with a content >96%)
Detector Energy Resolution: SDD detector, ≤129eV
Excitation Source: Tube voltage 5~50kV, tube current 0~1000uA
High Voltage Generator: Imported Spellman High Voltage
Testing Atmosphere: Atmospheric, Vacuum, Helium
Sample Introduction System: 9 sample chambers (with cup rotation), 12 sample chambers + single chamber, 20 sample chambers + single chamber (optional), controlled by PLC
Any number of automatically matchable or selectable analysis and identification models.
Mutually independent matrix effect correction model
Multivariate nonlinear regression program
Temperature Range: 15°C to 30°C
Power Supply: AC 220V ± 5V, recommended to configure with AC purified stabilized power supply
Instrument Size: 646 (W) × 578 (D) × 388 (H) mm
Sample Chamber Size: Φ340 × 64 (H) mm
Instrument Weight: 85KG
| Technical Specifications |
| Measurable elements: |
Fluorine( F ) - Uranium ( U ) |
| Precision: |
up to 0.05% |
| Analysis Range: |
ppm up to 99.99% |
| Energy Resolution |
150±5eV |
| Power: |
AC 220V ± 5V or AC 110V ± 5V. AC purified power supply |
| X-Ray Tube voltage: |
5KV-50KV |
| X-Ray Tube current: |
50 uA-1000 uA |
| Plating thickness measurement: |
more than 11 layers, up to 0.005μm each layer |
| Sample types: |
powder, solid and liquid |
| Weight: |
85 kg |
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